Sanaz Salem, Hamed Zandevakili, Ali Mahani, Mohsen Saneei. Fault-tolerant delay cell for ring oscillator application in 65 nm CMOS technology. IET Circuits, Devices & Systems, 12(3):233-241, 2018. [doi]
@article{SalemZMS18,
title = {Fault-tolerant delay cell for ring oscillator application in 65 nm CMOS technology},
author = {Sanaz Salem and Hamed Zandevakili and Ali Mahani and Mohsen Saneei},
year = {2018},
doi = {10.1049/iet-cds.2017.0380},
url = {https://doi.org/10.1049/iet-cds.2017.0380},
researchr = {https://researchr.org/publication/SalemZMS18},
cites = {0},
citedby = {0},
journal = {IET Circuits, Devices & Systems},
volume = {12},
number = {3},
pages = {233-241},
}