NBTI Degradation: A Problem or a Scare? - researchr publication authors

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Kewal K. Saluja, Shriram Vijayakumar, Warin Sootkaneung, Xaingning Yang. NBTI Degradation: A Problem or a Scare?. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 137-142, IEEE Computer Society, 2008. [doi]

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