Vahid Samavatian, Mahmud Fotuhi-Firuzabad, Payman Dehghanian, Frede Blaabjerg. Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes. IEEE Access, 9:67096-67108, 2021. [doi]
@article{SamavatianFDB21,
title = {Reliability Modeling of Multistate Degraded Power Electronic Converters With Simultaneous Exposure to Dependent Competing Failure Processes},
author = {Vahid Samavatian and Mahmud Fotuhi-Firuzabad and Payman Dehghanian and Frede Blaabjerg},
year = {2021},
doi = {10.1109/ACCESS.2021.3075974},
url = {https://doi.org/10.1109/ACCESS.2021.3075974},
researchr = {https://researchr.org/publication/SamavatianFDB21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {67096-67108},
}