Vignesh Sampath, Iñaki Maurtua, Juan José Aguilar Martín, Andoni Rivera, Jorge Molina, Aitor Gutierrez. Attention-Guided Multitask Learning for Surface Defect Identification. IEEE Trans. Industrial Informatics, 19(9):9713-9721, 2023. [doi]
@article{SampathMMRMG23,
title = {Attention-Guided Multitask Learning for Surface Defect Identification},
author = {Vignesh Sampath and Iñaki Maurtua and Juan José Aguilar Martín and Andoni Rivera and Jorge Molina and Aitor Gutierrez},
year = {2023},
doi = {10.1109/TII.2023.3234030},
url = {https://doi.org/10.1109/TII.2023.3234030},
researchr = {https://researchr.org/publication/SampathMMRMG23},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Industrial Informatics},
volume = {19},
number = {9},
pages = {9713-9721},
}