Elena-Diana Sandru, Emilian David, Georg Pelz. Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations. In 27th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2020, Glasgow, Scotland, UK, November 23-25, 2020. pages 1-2, IEEE, 2020. [doi]
@inproceedings{SandruDP20,
title = {Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations},
author = {Elena-Diana Sandru and Emilian David and Georg Pelz},
year = {2020},
doi = {10.1109/ICECS49266.2020.9294956},
url = {https://doi.org/10.1109/ICECS49266.2020.9294956},
researchr = {https://researchr.org/publication/SandruDP20},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {27th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2020, Glasgow, Scotland, UK, November 23-25, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6044-3},
}