Victor M. van Santen, Hussam Amrouch, Jörg Henkel. Modeling and Evaluating the Gate Length Dependence of BTI. IEEE Trans. on Circuits and Systems, 66-II(9):1527-1531, 2019. [doi]
@article{SantenAH19a,
title = {Modeling and Evaluating the Gate Length Dependence of BTI},
author = {Victor M. van Santen and Hussam Amrouch and Jörg Henkel},
year = {2019},
doi = {10.1109/TCSII.2018.2885850},
url = {https://doi.org/10.1109/TCSII.2018.2885850},
researchr = {https://researchr.org/publication/SantenAH19a},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {66-II},
number = {9},
pages = {1527-1531},
}