T. Saad Saoud, S. Moindjie, Daniela Munteanu, Jean-Luc Autran. Natural radiation events in CCD imagers at ground level. Microelectronics Reliability, 64:68-72, 2016. [doi]
@article{SaoudMMA16,
title = {Natural radiation events in CCD imagers at ground level},
author = {T. Saad Saoud and S. Moindjie and Daniela Munteanu and Jean-Luc Autran},
year = {2016},
doi = {10.1016/j.microrel.2016.07.138},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.138},
researchr = {https://researchr.org/publication/SaoudMMA16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {68-72},
}