A Framework for Self-Diagnosis and Condition Monitoring for Embedded Systems Using a SOM-Based Classifier - researchr publication authors

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Pieter Sartain, Andrew B. T. Hopkins, Klaus D. McDonald-Maier, W. Gareth J. Howells. A Framework for Self-Diagnosis and Condition Monitoring for Embedded Systems Using a SOM-Based Classifier. In Didier Keymeulen, Tughrul Arslan, Martin Suess, Adrian Stoica, Ahmet T. Erdogan, David Merodio, editors, NASA/ESA Conference on Adaptive Hardware and Systems, AHS 2008, Noordwijk, The Netherlands, June 22-25, 2008. pages 417-423, IEEE Computer Society, 2008. [doi]

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