A Dual Configuration BIST-Based Modular Diagnostic Methodology for Embedded Cores in FPGAs

Alireza Sarvi, Jenny Fan, Reto Stamm. A Dual Configuration BIST-Based Modular Diagnostic Methodology for Embedded Cores in FPGAs. In Toomas P. Plaks, editor, Proceedings of the 2006 International Conference on Engineering of Reconfigurable Systems & Algorithms, ERSA 2006, Las Vegas, Nevada, USA, June 26-29, 2006. pages 251-252, CSREA Press, 2006.

@inproceedings{SarviFS06,
  title = {A Dual Configuration BIST-Based Modular Diagnostic Methodology for Embedded Cores in FPGAs},
  author = {Alireza Sarvi and Jenny Fan and Reto Stamm},
  year = {2006},
  tags = {rule-based, model-based diagnostics, meta-model, diagnostics, Meta-Environment},
  researchr = {https://researchr.org/publication/SarviFS06},
  cites = {0},
  citedby = {0},
  pages = {251-252},
  booktitle = {Proceedings of the 2006 International Conference on Engineering of Reconfigurable Systems & Algorithms, ERSA 2006, Las Vegas, Nevada, USA, June 26-29, 2006},
  editor = {Toomas P. Plaks},
  publisher = {CSREA Press},
  isbn = {1-60132-011-6},
}