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Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs

A. Sasikumar, A. R. Arehart, D. W. Cardwell, C. M. Jackson, W. Sun, Z. Zhang, S. A. Ringel. Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs. Microelectronics Reliability, 56:37-44, 2016. [doi]

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A. Sasikumar

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A. R. Arehart

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D. W. Cardwell

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C. M. Jackson

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W. Sun

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Z. Zhang

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S. A. Ringel

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