Elan Sasson, Gilad Ravid, Nava Pliskin. Modeling Technology Assessment via Knowledge Maps. In 47th Hawaii International Conference on System Sciences, HICSS 2014, Waikoloa, HI, USA, January 6-9, 2014. pages 924-933, IEEE, 2014. [doi]
@inproceedings{SassonRP14,
title = {Modeling Technology Assessment via Knowledge Maps},
author = {Elan Sasson and Gilad Ravid and Nava Pliskin},
year = {2014},
doi = {10.1109/HICSS.2014.122},
url = {http://doi.ieeecomputersociety.org/10.1109/HICSS.2014.122},
researchr = {https://researchr.org/publication/SassonRP14},
cites = {0},
citedby = {0},
pages = {924-933},
booktitle = {47th Hawaii International Conference on System Sciences, HICSS 2014, Waikoloa, HI, USA, January 6-9, 2014},
publisher = {IEEE},
}