Amit P. Sawant, Ravi Raina, Christopher G. Healey. ::::ChipViz:::: : Visualizing Memory Chip Test Data. In George Bebis, Richard D. Boyle, Bahram Parvin, Darko Koracin, Nikos Paragios, Tanveer Fathima Syeda-Mahmood, Tao Ju, Zicheng Liu, Sabine Coquillart, Carolina Cruz-Neira, Torsten Müller, Thomas Malzbender, editors, Advances in Visual Computing, Third International Symposium, ISVC 2007, Lake Tahoe, NV, USA, November 26-28, 2007, Proceedings, Part II. Volume 4842 of Lecture Notes in Computer Science, pages 711-720, Springer, 2007. [doi]
@inproceedings{SawantRH07,
title = {::::ChipViz:::: : Visualizing Memory Chip Test Data},
author = {Amit P. Sawant and Ravi Raina and Christopher G. Healey},
year = {2007},
doi = {10.1007/978-3-540-76856-2_70},
url = {http://dx.doi.org/10.1007/978-3-540-76856-2_70},
tags = {testing, data-flow},
researchr = {https://researchr.org/publication/SawantRH07},
cites = {0},
citedby = {0},
pages = {711-720},
booktitle = {Advances in Visual Computing, Third International Symposium, ISVC 2007, Lake Tahoe, NV, USA, November 26-28, 2007, Proceedings, Part II},
editor = {George Bebis and Richard D. Boyle and Bahram Parvin and Darko Koracin and Nikos Paragios and Tanveer Fathima Syeda-Mahmood and Tao Ju and Zicheng Liu and Sabine Coquillart and Carolina Cruz-Neira and Torsten Müller and Thomas Malzbender},
volume = {4842},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-540-76855-5},
}