Reinhard Schachtner, Gerhard Pöppel, Elmar Wolfgang Lang. Nonnegative Matrix Factorization for Binary Data to Extract Elementary Failure Maps from Wafer Test Images. In Andreas Fink, Berthold Lausen, Wilfried Seidel, Alfred Ultsch, editors, Advances in Data Analysis, Data Handling and Business Intelligence - Proceedings of the 32nd Annual Conference of the Gesellschaft für Klassifikation e.V., Joint Conference with the British Classification Society (BCS) and the Dutch/Flemish Classification Society (VOC), Helmut-Schmidt-University, Hamburg, July 16-18, 2008. Studies in Classification, Data Analysis, and Knowledge Organization, pages 755-764, Springer, 2008. [doi]
@inproceedings{SchachtnerPL08,
title = {Nonnegative Matrix Factorization for Binary Data to Extract Elementary Failure Maps from Wafer Test Images},
author = {Reinhard Schachtner and Gerhard Pöppel and Elmar Wolfgang Lang},
year = {2008},
doi = {10.1007/978-3-642-01044-6_69},
url = {http://dx.doi.org/10.1007/978-3-642-01044-6_69},
researchr = {https://researchr.org/publication/SchachtnerPL08},
cites = {0},
citedby = {0},
pages = {755-764},
booktitle = {Advances in Data Analysis, Data Handling and Business Intelligence - Proceedings of the 32nd Annual Conference of the Gesellschaft für Klassifikation e.V., Joint Conference with the British Classification Society (BCS) and the Dutch/Flemish Classification Society (VOC), Helmut-Schmidt-University, Hamburg, July 16-18, 2008},
editor = {Andreas Fink and Berthold Lausen and Wilfried Seidel and Alfred Ultsch},
series = {Studies in Classification, Data Analysis, and Knowledge Organization},
publisher = {Springer},
isbn = {978-3-642-01043-9},
}