Jan Schat. Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns. In Bernd Straube, Milos Drutarovský, Michel Renovell, Peter Gramata, Mária Fischerová, editors, Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008. pages 235-240, IEEE Computer Society, 2008. [doi]
@inproceedings{Schat08, title = {Calculating the fault coverage for dual neighboring faults using single stuck-at fault patterns}, author = {Jan Schat}, year = {2008}, doi = {10.1109/DDECS.2008.4538792}, url = {http://dx.doi.org/10.1109/DDECS.2008.4538792}, tags = {coverage}, researchr = {https://researchr.org/publication/Schat08}, cites = {0}, citedby = {0}, pages = {235-240}, booktitle = {Proceedings of the 11th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2008), Bratislava, Slovakia, April 16-18, 2008}, editor = {Bernd Straube and Milos Drutarovský and Michel Renovell and Peter Gramata and Mária Fischerová}, publisher = {IEEE Computer Society}, isbn = {978-1-4244-2276-0}, }