Bayesian deblurring with integrated noise estimation

Uwe Schmidt, Kevin Schelten, Stefan Roth. Bayesian deblurring with integrated noise estimation. In The 24th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2011, Colorado Springs, CO, USA, 20-25 June 2011. pages 2625-2632, IEEE, 2011. [doi]

Authors

Uwe Schmidt

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Kevin Schelten

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Stefan Roth

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