Process and Device Simulation of Schottky Barrier MOSFETs for Analysis of Current Injection - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Mike Schwarz, Laurie E. Calvet, John P. Snyder, Tillmann Krauss, Udo Schwalke, Alexander Kloes. Process and Device Simulation of Schottky Barrier MOSFETs for Analysis of Current Injection. In 25th International Conference "Mixed Design of Integrated Circuits and System", MIXDES 2018, Gdynia, Poland, June 21-23, 2018. pages 67-72, IEEE, 2018. [doi]

This author has not been identified. Look up 'Mike Schwarz' in GoogleThis author has not been identified. Look up 'Laurie E. Calvet' in GoogleThis author has not been identified. Look up 'John P. Snyder' in GoogleThis author has not been identified. Look up 'Tillmann Krauss' in GoogleThis author has not been identified. Look up 'Udo Schwalke' in GoogleThis author has not been identified. Look up 'Alexander Kloes' in Google

runs on WebDSL