Christian Sebeke, J. P. Teixeira, Michael J. Ohletz. Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits. In 1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995. pages 464-468, IEEE Computer Society, 1995. [doi]
@inproceedings{SebekeTO95,
title = {Automatic fault extraction and simulation of layout realistic faults for integrated analogue circuits},
author = {Christian Sebeke and J. P. Teixeira and Michael J. Ohletz},
year = {1995},
doi = {10.1109/EDTC.1995.470319},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1995.470319},
researchr = {https://researchr.org/publication/SebekeTO95},
cites = {0},
citedby = {0},
pages = {464-468},
booktitle = {1995 European Design and Test Conference, ED&TC 1995, Paris, France, March 6-9, 1995},
publisher = {IEEE Computer Society},
isbn = {0-8186-7039-8},
}