Development of a new standard for test

William W. Sebesta, Bas Verhelst, Michael G. Wahl. Development of a new standard for test. In Proceedings IEEE International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990. pages 988-993, IEEE Computer Society, 1990. [doi]

Authors

William W. Sebesta

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Bas Verhelst

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Michael G. Wahl

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