Mahshid Sedghi, Elnaz Koopahi, Armin Alaghi, Mahmood Fathy, Zainalabedin Navabi. An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations. In 21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India. pages 409-414, IEEE Computer Society, 2008. [doi]
@inproceedings{SedghiKAFN08,
title = {An NoC Test Strategy Based on Flooding with Power, Test Time and Coverage Considerations},
author = {Mahshid Sedghi and Elnaz Koopahi and Armin Alaghi and Mahmood Fathy and Zainalabedin Navabi},
year = {2008},
doi = {10.1109/VLSI.2008.111},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSI.2008.111},
tags = {rule-based, test coverage, testing, coverage},
researchr = {https://researchr.org/publication/SedghiKAFN08},
cites = {0},
citedby = {0},
pages = {409-414},
booktitle = {21st International Conference on VLSI Design (VLSI Design 2008), 4-8 January 2008, Hyderabad, India},
publisher = {IEEE Computer Society},
}