Boundary-scan: beyond production test

Richard M. Sedmark. Boundary-scan: beyond production test. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 415-420, IEEE Computer Society, 1994. [doi]

Authors

Richard M. Sedmark

This author has not been identified. Look up 'Richard M. Sedmark' in Google