Clemens Seibold, Anna Hilsmann, Andrey Makrushin, Christian Kraetzer, Tom Neubert, Jana Dittmann, Peter Eisert. Visual Feature Space Analyses of Face Morphing Detectors. In IEEE International Workshop on Information Forensics and Security, WIFS 2019, Delft, The Netherlands, December 9-12, 2019. pages 1-6, IEEE, 2019. [doi]
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