Guilherme Otavio de Sena, Rivalino Matias. A Systematic Mapping Review of Memory Leak Detection Techniques. In Sudipto Ghosh, Roberto Natella, Bojan Cukic, Robin Poston, Nuno Laranjeiro, editors, 2018 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Memphis, TN, USA, October 15-18, 2018. pages 264-270, IEEE, 2018. [doi]
@inproceedings{SenaM18,
title = {A Systematic Mapping Review of Memory Leak Detection Techniques},
author = {Guilherme Otavio de Sena and Rivalino Matias},
year = {2018},
doi = {10.1109/ISSREW.2018.00017},
url = {https://doi.org/10.1109/ISSREW.2018.00017},
researchr = {https://researchr.org/publication/SenaM18},
cites = {0},
citedby = {0},
pages = {264-270},
booktitle = {2018 IEEE International Symposium on Software Reliability Engineering Workshops, ISSRE Workshops, Memphis, TN, USA, October 15-18, 2018},
editor = {Sudipto Ghosh and Roberto Natella and Bojan Cukic and Robin Poston and Nuno Laranjeiro},
publisher = {IEEE},
isbn = {978-1-5386-9443-5},
}