Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise - researchr publication authors

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Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee. Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise. In 26th IEEE VLSI Test Symposium (VTS 2008), April 27 - May 1, 2008, San Diego, California, USA. pages 175-180, IEEE Computer Society, 2008. [doi]

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