J. Y. Seo, K. J. Lee, Y. S. Kim, S. Y. Lee, S. J. Hwang, C. K. Yoon. Reliability for Recessed Channel Structure n-MOSFET. Microelectronics Reliability, 45(9-11):1317-1320, 2005. [doi]
@article{SeoLKLHY05,
title = {Reliability for Recessed Channel Structure n-MOSFET},
author = {J. Y. Seo and K. J. Lee and Y. S. Kim and S. Y. Lee and S. J. Hwang and C. K. Yoon},
year = {2005},
doi = {10.1016/j.microrel.2005.07.013},
url = {http://dx.doi.org/10.1016/j.microrel.2005.07.013},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/SeoLKLHY05},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {9-11},
pages = {1317-1320},
}