Nak Hee Seong, Dong Hyuk Woo, Hsien-Hsin S. Lee. Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out. IEEE Micro, 31(1):119-127, 2011. [doi]
@article{SeongWL11,
title = {Security Refresh: Protecting Phase-Change Memory against Malicious Wear Out},
author = {Nak Hee Seong and Dong Hyuk Woo and Hsien-Hsin S. Lee},
year = {2011},
doi = {10.1109/MM.2010.101},
url = {http://dx.doi.org/10.1109/MM.2010.101},
tags = {security},
researchr = {https://researchr.org/publication/SeongWL11},
cites = {0},
citedby = {0},
journal = {IEEE Micro},
volume = {31},
number = {1},
pages = {119-127},
}