Machine Learning Powered A/B Testing

Pavel Serdyukov. Machine Learning Powered A/B Testing. In Noriko Kando, Tetsuya Sakai, Hideo Joho, Hang Li, Arjen P. de Vries, Ryen W. White, editors, Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017. pages 1365, ACM, 2017. [doi]

@inproceedings{Serdyukov17,
  title = {Machine Learning Powered A/B Testing},
  author = {Pavel Serdyukov},
  year = {2017},
  doi = {10.1145/3077136.3096468},
  url = {http://doi.acm.org/10.1145/3077136.3096468},
  researchr = {https://researchr.org/publication/Serdyukov17},
  cites = {0},
  citedby = {0},
  pages = {1365},
  booktitle = {Proceedings of the 40th International ACM SIGIR Conference on Research and Development in Information Retrieval, Shinjuku, Tokyo, Japan, August 7-11, 2017},
  editor = {Noriko Kando and Tetsuya Sakai and Hideo Joho and Hang Li and Arjen P. de Vries and Ryen W. White},
  publisher = {ACM},
  isbn = {978-1-4503-5022-8},
}