Yuval Sered, Yoram Reich. Standardization and modularization driven by minimizing overall process effort. Computer-Aided Design, 38(5):405-416, 2006. [doi]
@article{SeredR06,
title = {Standardization and modularization driven by minimizing overall process effort},
author = {Yuval Sered and Yoram Reich},
year = {2006},
doi = {10.1016/j.cad.2005.11.005},
url = {http://dx.doi.org/10.1016/j.cad.2005.11.005},
researchr = {https://researchr.org/publication/SeredR06},
cites = {0},
citedby = {0},
journal = {Computer-Aided Design},
volume = {38},
number = {5},
pages = {405-416},
}