Thomas Severiens. Quality Measurement beyond Bibliometry. In IIAI 4th International Congress on Advanced Applied Informatics, IIAI-AAI 2015, Okayama, Japan, July 12-16, 2015. pages 483-486, IEEE, 2015. [doi]
@inproceedings{Severiens15, title = {Quality Measurement beyond Bibliometry}, author = {Thomas Severiens}, year = {2015}, doi = {10.1109/IIAI-AAI.2015.219}, url = {https://doi.org/10.1109/IIAI-AAI.2015.219}, researchr = {https://researchr.org/publication/Severiens15}, cites = {0}, citedby = {0}, pages = {483-486}, booktitle = {IIAI 4th International Congress on Advanced Applied Informatics, IIAI-AAI 2015, Okayama, Japan, July 12-16, 2015}, publisher = {IEEE}, isbn = {978-1-4799-9958-3}, }