Sequential testing algorithms for multiple fault diagnosis

M. Shakeri, Vijay Raghavan, Krishna R. Pattipati, Ann Patterson-Hine. Sequential testing algorithms for multiple fault diagnosis. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 30(1):1-14, 2000.

Authors

M. Shakeri

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Vijay Raghavan

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Krishna R. Pattipati

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Ann Patterson-Hine

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