Alon Shakevsky, Eyal Ronen, Avishai Wool. Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster Design. IACR Cryptology ePrint Archive, 2022:208, 2022. [doi]
@article{ShakevskyRW22,
title = {Trust Dies in Darkness: Shedding Light on Samsung's TrustZone Keymaster Design},
author = {Alon Shakevsky and Eyal Ronen and Avishai Wool},
year = {2022},
url = {https://eprint.iacr.org/2022/208},
researchr = {https://researchr.org/publication/ShakevskyRW22},
cites = {0},
citedby = {0},
journal = {IACR Cryptology ePrint Archive},
volume = {2022},
pages = {208},
}