Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network

Dexing Shan, Yunzhou Zhang, Sonya Coleman, Dermot Kerr, Shitong Liu, Ziqiang Hu. Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network. IEEE Trans. Industrial Informatics, 19(7):8072-8082, July 2023. [doi]

@article{ShanZCKLH23,
  title = {Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network},
  author = {Dexing Shan and Yunzhou Zhang and Sonya Coleman and Dermot Kerr and Shitong Liu and Ziqiang Hu},
  year = {2023},
  month = {July},
  doi = {10.1109/TII.2022.3216900},
  url = {https://doi.org/10.1109/TII.2022.3216900},
  researchr = {https://researchr.org/publication/ShanZCKLH23},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Industrial Informatics},
  volume = {19},
  number = {7},
  pages = {8072-8082},
}