Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices

Yang Shang, Wei Fei, Hao Yu. Analysis and Modeling of Internal State Variables for Dynamic Effects of Nonvolatile Memory Devices. IEEE Trans. on Circuits and Systems, 59-I(9):1906-1918, 2012. [doi]

Authors

Yang Shang

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Wei Fei

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Hao Yu

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