TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither

Yuling Shang, Min Tan, Chunquan Li, Liyuan Sun. TSV Manufacturing Fault Modeling and Diagnosis Based on Multi-Tone Dither. JACIII, 23(1):42-51, 2019. [doi]

Authors

Yuling Shang

This author has not been identified. Look up 'Yuling Shang' in Google

Min Tan

This author has not been identified. Look up 'Min Tan' in Google

Chunquan Li

This author has not been identified. Look up 'Chunquan Li' in Google

Liyuan Sun

This author has not been identified. Look up 'Liyuan Sun' in Google