A New Soft-Sensor-Based Process Monitoring Scheme Incorporating Infrequent KPI Measurements

Yuri A. W. Shardt, Haiyang Hao, Steven X. Ding. A New Soft-Sensor-Based Process Monitoring Scheme Incorporating Infrequent KPI Measurements. IEEE Transactions on Industrial Electronics, 62(6):3843-3851, 2015. [doi]

Authors

Yuri A. W. Shardt

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Haiyang Hao

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Steven X. Ding

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