Carthik A. Sharma, Ronald F. DeMara. A combinatorial group testing method for FPGA fault location. In Sartaj Sahni, editor, IASTED International Conference on Advances in Computer Science and Technology, January 23-25, 2006, Puerto Vallarta, Mexico. pages 55-60, IASTED/ACTA Press, 2006.
@inproceedings{SharmaD06:0,
title = {A combinatorial group testing method for FPGA fault location},
author = {Carthik A. Sharma and Ronald F. DeMara},
year = {2006},
tags = {testing},
researchr = {https://researchr.org/publication/SharmaD06%3A0},
cites = {0},
citedby = {0},
pages = {55-60},
booktitle = {IASTED International Conference on Advances in Computer Science and Technology, January 23-25, 2006, Puerto Vallarta, Mexico},
editor = {Sartaj Sahni},
publisher = {IASTED/ACTA Press},
isbn = {0-88986-547-7},
}