Vijay Kumar Sharma, Manisha Pattanaik, Balwinder Raj. PVT variations aware low leakage INDEP approach for nanoscale CMOS circuits. Microelectronics Reliability, 54(1):90-99, 2014. [doi]
@article{SharmaPR14,
title = {PVT variations aware low leakage INDEP approach for nanoscale CMOS circuits},
author = {Vijay Kumar Sharma and Manisha Pattanaik and Balwinder Raj},
year = {2014},
doi = {10.1016/j.microrel.2013.09.018},
url = {http://dx.doi.org/10.1016/j.microrel.2013.09.018},
researchr = {https://researchr.org/publication/SharmaPR14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {1},
pages = {90-99},
}