Enhancing Sequential LEC Using a Cumulative Verification Methodology

Nathan Sheeley, Nicolas Pena, Irfan Waheed, Mark Nodine. Enhancing Sequential LEC Using a Cumulative Verification Methodology. In Ninth International Workshop on Microprocessor Test and Verification, MTV 2008, Austin, Texas, USA, 8-10 December 2008. pages 39-42, IEEE Computer Society, 2008. [doi]

Authors

Nathan Sheeley

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Nicolas Pena

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Irfan Waheed

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Mark Nodine

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