Time-integrated photon emission as a function of temperature in 32 nm CMOS - researchr publication authors

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Andrea Bahgat Shehata, Alan J. Weger, Franco Stellari, Peilin Song, Hervé Deslandes, Ted Lundquist, Euan Ramsay. Time-integrated photon emission as a function of temperature in 32 nm CMOS. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]

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