Sanaz Sheikhi, Edward Kim, Parasara Sridhar Duggirala, Stanley Bak. Coverage-Guided Fuzz Testing for Cyber-Physical Systems. In 13th ACM/IEEE International Conference on Cyber-Physical Systems, ICCPS 2022, Milano, Italy, May 4-6, 2022. pages 24-33, IEEE, 2022. [doi]
@inproceedings{SheikhiKDB22,
title = {Coverage-Guided Fuzz Testing for Cyber-Physical Systems},
author = {Sanaz Sheikhi and Edward Kim and Parasara Sridhar Duggirala and Stanley Bak},
year = {2022},
doi = {10.1109/ICCPS54341.2022.00009},
url = {https://doi.org/10.1109/ICCPS54341.2022.00009},
researchr = {https://researchr.org/publication/SheikhiKDB22},
cites = {0},
citedby = {0},
pages = {24-33},
booktitle = {13th ACM/IEEE International Conference on Cyber-Physical Systems, ICCPS 2022, Milano, Italy, May 4-6, 2022},
publisher = {IEEE},
isbn = {978-1-6654-0967-4},
}