Mark Sheinin, Yoav Y. Schechner. Depth From Texture Integration. In IEEE International Conference on Computational Photography, ICCP 2019, Tokyo, Japan, May 15-17, 2019. pages 1-10, IEEE, 2019. [doi]
@inproceedings{SheininS19,
title = {Depth From Texture Integration},
author = {Mark Sheinin and Yoav Y. Schechner},
year = {2019},
doi = {10.1109/ICCPHOT.2019.8747333},
url = {https://doi.org/10.1109/ICCPHOT.2019.8747333},
researchr = {https://researchr.org/publication/SheininS19},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {IEEE International Conference on Computational Photography, ICCP 2019, Tokyo, Japan, May 15-17, 2019},
publisher = {IEEE},
isbn = {978-1-7281-3263-1},
}