An Efficiency Optimization Scheme for the On-the-Fly Statistical Randomness Test - researchr publication authors

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Jiahui Shen, Tianyu Chen, Lei Wang, Yuan Ma. An Efficiency Optimization Scheme for the On-the-Fly Statistical Randomness Test. In Sihan Qing, Chris Mitchell, Liqun Chen, Dongmei Liu, editors, Information and Communications Security - 19th International Conference, ICICS 2017, Beijing, China, December 6-8, 2017, Proceedings. Volume 10631 of Lecture Notes in Computer Science, pages 17-35, Springer, 2017. [doi]

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