Zixin Shen, Amos Hong, Argon Chen. Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters. AI in Engineering, 48:101283, 2021. [doi]
@article{ShenHC21,
title = {Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters},
author = {Zixin Shen and Amos Hong and Argon Chen},
year = {2021},
doi = {10.1016/j.aei.2021.101283},
url = {https://doi.org/10.1016/j.aei.2021.101283},
researchr = {https://researchr.org/publication/ShenHC21},
cites = {0},
citedby = {0},
journal = {AI in Engineering},
volume = {48},
pages = {101283},
}