Hao Shen, Xiaolin Ju, Xiang Chen 0005, Guang Yang. EDP-BGCNN: Effective Defect Prediction via BERT-based Graph Convolutional Neural Network. In Hossain Shahriar, Yuuichi Teranishi, Alfredo Cuzzocrea, Moushumi Sharmin, Dave Towey, A. K. M. Jahangir Alam Majumder, Hiroki Kashiwazaki, Ji-Jiang Yang, Michiharu Takemoto, Nazmus Sakib, Ryohei Banno, Sheikh Iqbal Ahamed, editors, 47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023. pages 850-859, IEEE, 2023. [doi]
@inproceedings{ShenJCY23,
title = {EDP-BGCNN: Effective Defect Prediction via BERT-based Graph Convolutional Neural Network},
author = {Hao Shen and Xiaolin Ju and Xiang Chen 0005 and Guang Yang},
year = {2023},
doi = {10.1109/COMPSAC57700.2023.00114},
url = {https://doi.org/10.1109/COMPSAC57700.2023.00114},
researchr = {https://researchr.org/publication/ShenJCY23},
cites = {0},
citedby = {0},
pages = {850-859},
booktitle = {47th IEEE Annual Computers, Software, and Applications Conference, COMPSAC 2023, Torino, Italy, June 26-30, 2023},
editor = {Hossain Shahriar and Yuuichi Teranishi and Alfredo Cuzzocrea and Moushumi Sharmin and Dave Towey and A. K. M. Jahangir Alam Majumder and Hiroki Kashiwazaki and Ji-Jiang Yang and Michiharu Takemoto and Nazmus Sakib and Ryohei Banno and Sheikh Iqbal Ahamed},
publisher = {IEEE},
isbn = {979-8-3503-2697-0},
}