Be Bayesian by attachments to catch more uncertainty

Shiyu Shen, Bin Pan, Tianyang Shi, Tao Li 0022, Zhenwei Shi 0001. Be Bayesian by attachments to catch more uncertainty. Pattern Recognition, 175:113084, 2026. [doi]

Authors

Shiyu Shen

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Bin Pan

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Tianyang Shi

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Tao Li 0022

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Zhenwei Shi 0001

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