Be Bayesian by attachments to catch more uncertainty - researchr publication authors

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Shiyu Shen, Bin Pan, Tianyang Shi, Tao Li 0022, Zhenwei Shi 0001. Be Bayesian by attachments to catch more uncertainty. Pattern Recognition, 175:113084, 2026. [doi]

This author has not been identified. Look up 'Shiyu Shen' in GoogleThis author has not been identified. Look up 'Bin Pan' in GoogleThis author has not been identified. Look up 'Tianyang Shi' in GoogleThis author has not been identified. Look up 'Tao Li 0022' in GoogleThis author has not been identified. Look up 'Zhenwei Shi 0001' in Google

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