John W. Sheppard, William R. Simpson. Improving the accuracy of diagnostics provided by fault dictionaries. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 180-185, IEEE Computer Society, 1996. [doi]
@inproceedings{SheppardS96, title = {Improving the accuracy of diagnostics provided by fault dictionaries}, author = {John W. Sheppard and William R. Simpson}, year = {1996}, url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040180abs.htm}, tags = {diagnostics}, researchr = {https://researchr.org/publication/SheppardS96}, cites = {0}, citedby = {0}, pages = {180-185}, booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA}, publisher = {IEEE Computer Society}, }