A 50 ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit - researchr publication authors

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Shyh-Shyuan Sheu, Kuo-Hsing Cheng, Yu-Sheng Chen, Pang-Shiu Chen, Ming-Jinn Tsai, Yu-lung Lo. A 50 ns Verify Speed in Resistive Random Access Memory by Using a Write Resistance Tracking Circuit. IEICE Transactions, 95-C(6):1128-1131, 2012. [doi]

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