SPIN-TEST: automatic test pattern generation for speed-independent circuits - researchr publication authors

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Feng Shi, Yiorgos Makris. SPIN-TEST: automatic test pattern generation for speed-independent circuits. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 903-908, IEEE Computer Society / ACM, 2004. [doi]

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