Yao Shi, Soyeon Park, Zuoning Yin, Shan Lu, Yuanyuan Zhou, Wenguang Chen, Weimin Zheng. Do I use the wrong definition?: DeFuse: definition-use invariants for detecting concurrency and sequential bugs. In William R. Cook, Siobhán Clarke, Martin C. Rinard, editors, Proceedings of the 25th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2010, October 17-21, 2010, Reno/Tahoe, Nevada, USA. pages 160-174, ACM, Reno/Tahoe, Nevada, 2010. [doi]
@inproceedings{ShiPYLZCZ10,
title = {Do I use the wrong definition?: DeFuse: definition-use invariants for detecting concurrency and sequential bugs},
author = {Yao Shi and Soyeon Park and Zuoning Yin and Shan Lu and Yuanyuan Zhou and Wenguang Chen and Weimin Zheng},
year = {2010},
doi = {10.1145/1869459.1869474},
url = {http://doi.acm.org/10.1145/1869459.1869474},
researchr = {https://researchr.org/publication/ShiPYLZCZ10},
cites = {0},
citedby = {0},
pages = {160-174},
booktitle = {Proceedings of the 25th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2010},
editor = {William R. Cook and Siobhán Clarke and Martin C. Rinard},
address = {Reno/Tahoe, Nevada},
publisher = {ACM},
isbn = {978-1-4503-0203-6},
}