Two-sided empirical Bayes test for truncation parameter using NA samples

Yimin Shi, Xiaolin Shi, Jie Yan. Two-sided empirical Bayes test for truncation parameter using NA samples. Inf. Sci., 173(1-3):65-74, 2005. [doi]

Authors

Yimin Shi

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Xiaolin Shi

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Jie Yan

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