Sansheng Shi, Wei Wang, Wenqi Zhi, Minzhe Tian, Mengxi Li. Development of Standard Measurement Device for 0.1Hz VLF Dielectric Loss Tester. In 4th International Conference on Artificial Intelligence and Advanced Manufacturing, AIAM 2022, Hamburg, Germany, October 7-9, 2022. pages 838-841, IEEE, 2022. [doi]
@inproceedings{ShiWZTL22,
title = {Development of Standard Measurement Device for 0.1Hz VLF Dielectric Loss Tester},
author = {Sansheng Shi and Wei Wang and Wenqi Zhi and Minzhe Tian and Mengxi Li},
year = {2022},
doi = {10.1109/AIAM57466.2022.00170},
url = {https://doi.org/10.1109/AIAM57466.2022.00170},
researchr = {https://researchr.org/publication/ShiWZTL22},
cites = {0},
citedby = {0},
pages = {838-841},
booktitle = {4th International Conference on Artificial Intelligence and Advanced Manufacturing, AIAM 2022, Hamburg, Germany, October 7-9, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6399-7},
}